光盘镀层厚度检测-capa

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发布日期：2014-06-06 浏览： 次

光盘镍层厚度测量

我们日常生活中大量使用CDs, DVDs, HD-DVDs 还有蓝光光盘存储数据。这些光盘的基材（硅或玻璃）表面，需要附上一薄层镍。镍层的绝对厚度需要得到测量，用以控制电镀过程。德国米铱公司提供的电容式位移传感器被用来测量镍层厚度和外轮廓。两个探头分别位于被测光盘上下两端，移动被测光盘，就可以得到测量结果。用两支电容式位移传感器测量结果相减，可以得到非常精准的厚度数值。

Previously, the data was transferred to a master system using a laser to reproduce CDs, DVDs, HD-DVDs or Blu-ray discs by pressing. A thin layer of nickel is applied using galvanisation to the silicon or glass carrier (substrate). The absolute thickness values of the nickel layer are required in order for the exact control of the galvanisation bath. Capacitive sensors from Micro-Epsilon are used to measure the thickness and profile.  A sensor is positioned above and below the die, which is then moved between the sensors during measurements. Using the two units for distance information, the thickness is determined very precisely using the differential method.